評價內存(cun)條的性能指(zhi)標(biao)一共有(you)四(si)個：
(1) 存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)容(rong)(rong)(rong)量(liang)(liang)(liang)：即(ji)一(yi)(yi)(yi)根內存(cun)(cun)(cun)(cun)(cun)(cun)條可以(yi)容(rong)(rong)(rong)納(na)的(de)二(er)進制(zhi)信息量(liang)(liang)(liang)，如(ru)常用的(de)168線內存(cun)(cun)(cun)(cun)(cun)(cun)條的(de)存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)容(rong)(rong)(rong)量(liang)(liang)(liang)一(yi)(yi)(yi)般多為(wei)(wei)32兆、64兆和128兆。而(er)DDRII3普遍為(wei)(wei)1GB到8GB。 (2) 存(cun)(cun)(cun)(cun)(cun)(cun)取速(su)度(du)（存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)周期）：即(ji)兩(liang)次獨立的(de)存(cun)(cun)(cun)(cun)(cun)(cun)取操作之間(jian)(jian)(jian)所需的(de)最短時(shi)間(jian)(jian)(jian)，又稱為(wei)(wei)存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)周期，半導體存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)器的(de)存(cun)(cun)(cun)(cun)(cun)(cun)取周期一(yi)(yi)(yi)般為(wei)(wei)60納(na)秒至100納(na)秒。 (3) 存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)器的(de)可靠性(xing)(xing)：存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)器的(de)可靠性(xing)(xing)用平均故障間(jian)(jian)(jian)隔(ge)時(shi)間(jian)(jian)(jian)來衡(heng)量(liang)(liang)(liang)，可以(yi)理解為(wei)(wei)兩(liang)次故障之間(jian)(jian)(jian)的(de)平均時(shi)間(jian)(jian)(jian)間(jian)(jian)(jian)隔(ge)。 (4)性(xing)(xing)能(neng)價格比(bi)(bi)：性(xing)(xing)能(neng)主要(yao)包(bao)括存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)器容(rong)(rong)(rong)量(liang)(liang)(liang)、存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)周期和可靠性(xing)(xing)三(san)項內容(rong)(rong)(rong)，性(xing)(xing)能(neng)價格比(bi)(bi)是(shi)一(yi)(yi)(yi)個綜合性(xing)(xing)指標，對于不同的(de)存(cun)(cun)(cun)(cun)(cun)(cun)儲(chu)器有不同的(de)要(yao)求(qiu)。
